Increasing throughput in x-ray computed tomography measurement of surface topography using sinogram interpolation
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Measurement Science and Technology
سال: 2019
ISSN: 0957-0233,1361-6501
DOI: 10.1088/1361-6501/ab37e5